Switching circuit and method for testing the same

作者: Naoyuki Miyazawa

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摘要: There is provided a method for testing switching circuit including first FET connected between input/output terminals, capacitor one of the terminals and FET, second that in parallel with has gate electrode to ground terminal. The includes, applying potential sets conducting state terminal, DC test via FET.

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Katsue Kawakyu, Masami Nagaoka, Atsushi Kameyama, High frequency switch device, front end unit and transceiver ,(1998)
Ueda Masahiko, SEMICONDUCTOR INTEGRATED CIRCUIT ,(2000)