A Low-Noise Charge Sensitive Preamplifier for Semiconductor Detectors Using Paralleled Field-Effect-Transistors
作者： K. F. Smith , J. E. Cline
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摘要: … from flicker noise in the FET input stage, the total noise in the … (a) the thermal noise of the conducting channel modified by … a noise current which flows in the gate and is caused by noise …
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sci-hub.se 参考文章(7)
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