MeRLiN: Exploiting Dynamic Instruction Behavior for Fast and Accurate Microarchitecture Level Reliability Assessment

作者: Manolis Kaliorakis , Dimitris Gizopoulos , Ramon Canal , Antonio Gonzalez

DOI: 10.1145/3079856.3080225

关键词:

摘要: Early reliability assessment of hardware structures using microarchitecture level simulators can effectively guide major error protection decisions in microprocessor design. Statistical …

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