Polarization-Sensitive Tip-Enhanced Raman Scattering
作者： Pietro Giuseppe Gucciardi , Marc Lamy de La Chapelle , Jean-Christophe Valmalette , Gennaro Picardi , Razvigor Ossikovski
DOI: 10.1007/978-3-642-03535-7_3
关键词:
摘要: Tip-Enhanced Raman Spectroscopy (TERS) is a very promising analytical technique for high sensitivity, spatial resolution analysis of the physical and chemical properties nanoscale materials including nanocrystals, biomolecules, carbon-based nanostructures nanometer-size devices. Polarized TERS, in addition, offers novel opportunities contrast spectroscopy imaging semiconductor crystals crystalline nanostructures. This chapter reviews current state-of-the-art polarization-sensitive TERS focusing attention on experimental implementations technique, light scattering metallic probes, signal enhancement mechanisms and, finally, applications this technique.
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