作者: Thomas L. Thrasher , Christopher D. Lofstrom , Daniel N. Fox , David C. Neckels
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摘要: A method is provided for generating measurement parameters a particle sample in analyzer. The includes, interrogating the with triggering interrogator and one or more secondary interrogators respectively positioned along length of an interrogation area, respective pulses based upon first from sample, determining primary pulse detection window pulse, search interval to find factors including laser delay, adjusting delay variation dynamically on particle, identifying adjusted interval, processing determine peak value pulse. Corresponding apparatus are also provided.