作者: Elsayed O. Selim , Ronald T. Waters
关键词:
摘要: The conduction current to a probe incorporated into an electrode is proportional the strength of charge-carrier drift field; this modulated by bias voltage applied betwen and electrode. current/bias-voltage characteristics are described which have been derived from computation field distribution. From these design data can be used determine unknown carrier inherent self-verification capability feature technique. Examples applications direct-current point-plane corona given.