EBSD-assisted Laue microdiffraction for microstrain analysis

摘要: The X-ray Laue microdiffraction (µLaue) technique has been establishing itself as a reliable means for microstrain analysis the past few decades. One problem with this is that when crystal size significantly smaller than probed volume and diffracting crystals are closely oriented, large number of individual µLaue patterns superimposed in complex way on recorded diffraction images. In case, because difficulty isolating unambiguously single-grain pattern, strains tedious manually hardly achievable current automated methods. This issue even more severe low-symmetry or high-energy X-rays used, since each single-crystal pattern already contains spots. paper proposes overcoming challenge through development combined approach coupling electron backscatter (EBSD). capabilities `EBSD-assisted µLaue' method illustrated monoclinic zirconia-based specimen analysed orientation input from EBSD. obtained results statistically reliable, reproducible provide physical insight into micromechanical characteristics material.