Electron microscopy in solid state physics

摘要: 1. Methods of Investigation in Electron Microscopy. Conventional electron microscopy: fundamentals optics and instrumentation (H. Bethge, J. Heydenreich). image formation (J. Heydenreich, W. Neumann). diffraction: application (W. Neumann, K. Scheerschmidt). High-resolution microscopy R. Hillebrand, P. Werner). High-voltage (G. Kastner). Scanning electron-optical technical the instrument Johansen, U. physical foundations contrast (U. Werner, H. Johansen). Indirect imaging surfaces by replica decoration techniques M. Krohn, Stenzel). Special methods for direct surfaces: emission microscopy, reflection mirror Analytical combined imaging, diffraction spectroscopical Rechner, Schneider). Image processing T. Krajewski). 2. Applications Solid State Physics. Lattice defect (K. Scheerschmidt, Gleichmann). Basic processes plastic deformation Messerschmidt, F. Appel). Microprocesses fracture (V. Schmidt). Fractography with SEM (failure analysis) (M. Moser). Morphology polymers (G.H. Michler). Defects semiconductors devices (R. Gleichmann, Blumtritt, Molecular crystal growth (K.W. Keller, Hoche). Growth structure thin films Klaua). Dislocation arrangements grain boundaries interphase Scholz, Woltersdorf). The domain ferroelectric ferromagnetic solids (D. Hesse, K.-P. Meyer). Appendices: theoretical foundation microscope lattice its computer simulation Transmission a survey preparation Bartsch). Subject Index.