Three-Dimensional Surface Topography

作者: Liam Blunt , K.J. Stout

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摘要: Part I: Development of Surface Characterization 1. History the subject 2. surface parameters 3. Progress in filtering 4. Instrumentation 5. integrated 3-D parameter set 6. Future Developments 7. Contents proposed standard. II: Instruments and Measurement Techniques Three-dimensional Topography Introduction Differences measurement analysis methods for topography Stylus instruments Optical Non-optical scanning microscopy Characteristics different types available Conclusions. III: Filtering Technology Three-Dimensional Analysis. Nomenclature data filters general techniques Robust The problems frequency domain Wavelet digital 8. Motif 9. Conclusion. IV: Visualization Parameters Characterizing three dimensions 4.Visualization Specification A primary amplitude, height distribution, spatial, hybrid functional. V: Applications Metrology a gear with stylus lead screw-driven instrument an engine bore linear motor-driven thick-film superconductors focus detection human skin hip prostheses using phase shifting interferometer polished brass tunnelling microscope indentations VI: Engineered Surfaces - Philosophy Manufacture philosophy manufacture complex interrelationships producing engineered topographical features their effect on functional performance surfaces mechanical that can (surface integrity) Subsurface Some examples approach to An example comprehensive testing procedure FE simulations 10. Final comments.

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