作者: Qiumei Bian , Xiaoming Yu , Baozhen Zhao , Zenghu Chang , Shuting Lei
DOI: 10.1016/J.OPTLASTEC.2012.06.018
关键词:
摘要: Finding ways to scribe indium-tin oxide (ITO) coating plays an important role in the fabrication and assembly of thin film solar cells. Using a femtosecond (fs) laser, we selectively removed ITO films with thickness 120–160 nm on glass substrates. In particular, studied effect laser pulse duration, fluence scanning speed ablation ITO. The single thresholds at various durations were determined ablate films. Clean removal layer was observed when above threshold 0.30 J/cm