Grain‐Boundary Contrast in Field Ion Microscope Images
作者： R. D. French , G. H. Bishop
DOI: 10.1063/1.1660686
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摘要: The contrast in field ion microscope (FIM) images due to [110] symmetric tilt boundaries a bcc lattice was systematically investigated for misorientations up 26° by computer image simulation. In low‐angle grain there are three effects: dislocation spirals, cusps plane edges, and zone line displacement. way which those effects develop with increasing angle is discussed illustrated simulations. An important result that under favorable conditions the boundary dislocations could still be resolved simulation of high‐angle boundary.
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