The role of parasitic elements in the single-event transient response of linear circuits

作者: A.L. Sternberg , L.W. Massengill , S. Buchner , R.L. Pease , Y. Boulghassoul

DOI: 10.1109/TNS.2002.805340

关键词:

摘要: Parasitic elements can play an important role in the single-event transient sensitivity of a circuit. This work describes how parasitics affect simulation response linear circuits and shows have been identified using pulsed laser.

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