Method and apparatus for mass spectrometry

作者: Alexander Alekseevich Makarov

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摘要: A method for analysing ions according to their mass-to-charge ratio and mass spectrometer performing the method, comprising directing a collimated ion beam along an path from source detector, causing portion of contact one or more surfaces prior reaching wherein comprises providing coating on and/or heating reduce variation in surface patch potentials. The is applicable multi-reflection time-of-flight (MR TOF) spectrometry.

参考文章(25)
Konosuke Oishi, Masamichi Tsukada, Toyoharu Okumoto, Takashi Iino, Mass spectrometer, skimmer cone assembly, skimmer cone and its manufacturing method ,(1996)
Anatoli N. Verentchikov, Viatcheslav Artaev, Joel C. Mitchell, Mikhail Yavor, Multi reflecting time-of-flight mass spectrometer and a method of use ,(2004)
Andrew R. Bowdler, Emmanuel Raptakis, Ion optics system for TOF mass spectrometer ,(2001)
Mikhail A. Monastyrskiy, Dmitry E. Grinfeld, Alexander A. Makarov, Multireflection Time-Of-Flight Mass Spectrometer ,(2008)
Sadanori Sekiya, Kentaro Morimoto, Hidenori Takahashi, Masaki Murase, Mass spectrometer and mass spectrometric method ,(2012)
Agnes Tempez, Michael V. Ugarov, Vladislav Zelenov, J. Albert Schultz, Thomas F. Egan, Valeriy V. Raznikov, Gennadiy Savenkov, Multi-beam ion mobility time-of-flight mass spectrometry with multi-channel data recording ,(2006)