2.04 – Lattice strain measuring techniques

摘要: X-rays can be produced when the electrons with a high velocity are decelerated upon penetrating matter. It is electromagnetic waves wavelengths ranging from approximately 1 nm to 0.01 (10 0.1A ). The wavelength of this radiation characteristic for each element. origin X-ray explained according Bohr's model atom. sources either tubes static, or rotating anodes, and synchrotron radiation. characteristics that important selection suitable tube target material, focal size, maximum rating, intensity on specimen tested. mass-attenuation coefficient function wavelength. With tubes, only restricted variety peaks tested, whereas use allows access many more peaks.