作者: R. Chandramohan , T.A. Vijayan , S. Arumugam , H.B. Ramalingam , V. Dhanasekaran
DOI: 10.1016/J.MSEB.2010.10.017
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摘要: Abstract Investigations on the effect of annealing temperature structural, optical properties and morphology Al-doped ZnO thin films deposited glass substrate by chemical bath deposition have been carried out. X-ray diffraction studies revealed that are in polycrystalline nature with hexagonal structure along (0 0 2) crystallographic plane. Microstructural such as crystallite size, texture coefficient, stacking fault probability microstrain were calculated from predominant lines. The UV–Vis–NIR spectroscopy all high transmittance (>60%) visible range. band gap values found to be range 3.25–3.31 eV. Optical constants estimated n k increase heat treatment. increased fabricated this simple economic technique without using any carrier gas good structural which desirable for photovoltaic applications. Scanning electron microscopic images shaped grains occupy entire surface film its near stoichiometric composition.