Growth of thick La2Zr2O7 buffer layers for coated conductors by polymer-assisted chemical solution deposition
作者： Xin Zhang , Yong Zhao , Yudong Xia , Chunsheng Guo , C.H. Cheng
DOI: 10.1016/J.PHYSC.2015.03.014
关键词:
摘要: Abstract La 2 Zr O 7 (LZO) epitaxial films have been deposited on LaAlO 3 (LAO) (1 0 0) single-crystal surface and bi-axially textured NiW (2 0 0) alloy substrate by polymer-assisted chemical solution deposition, afterwards studied with XRD, SEM AFM approaches. Highly in-plane out-of-plane oriented, dense, smooth, crack free a sufficient thickness (>240 nm) LZO buffer layers obtained LAO surface; The are also found high degree texturing, good density pin-hole-free, micro-crack-free nature of 300 nm. 500 nm thick YBa Cu 7−x (YBCO) thin film exhibits the self-field critical current ( J c) reached 1.3 MA/cm at 77 K .These results demonstrate epi-films techniques potential to be layer for REBCO coated conductors.
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