作者: Tina Sabel , Michael Zschocher
DOI: 10.3390/APP4010019
关键词:
摘要: Volume phase gratings, recorded in a photosensitive polymer by two-beam interference exposure, are studied means of optical microscopy. Transmission gratings and reflection with periods the order 10 μm down to 130 nm, were investigated. Mapping holograms imaging sectional view is introduced study reflection-type evading resolution limit classical In addition, this technique applied examine so-called parasitic arising from incident reference beam reflected signal beam. The appearance possible avoidance such unintentionally secondary structures discussed.