A realistic defect oriented testability methodology for analog circuits

摘要: Owing to the non-binary nature of their operation, analog circuits are influenced by process defects in a different manner compared digital circuits. This calls for careful investigation into occurrence circuits, modeling related aspects and detection strategies. In this article, we demonstrate with help real CMOS circuit that simple test stimuli, like DC, transient AC, can detect most modeled defects. Silicon devices tested proposed methodology effectiveness method. Subsequently, method is implemented production environment along conventional comparative study. structured simpler, therefore results substantial cost reduction.