作者: D. Telesca , B. Sinkovic , See-Hun Yang , S.S.P. Parkin
DOI: 10.1016/J.ELSPEC.2012.04.002
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摘要: Abstract X-ray absorption spectroscopy and scattering have been used to determine the oxidation reactions at buried MgO/Fe interface as a result of deposition MgO. We confirm that Fe-oxide is present MgO/CoFe interfaces amounts less than 1 mL in thickness. The mixture different iron oxide phases within ultra-thin layer which can be reduced following annealing. observe transformation interfacial from more Fe2O3-like phase FeO-like annealing, this process most noticeable between 200 350 °C annealing steps. In addition, formation bulk like MgO electronic structure was observed.