作者: Mya Theingi , Ji Ma , Hui Zhang , Qi Cui , Jianhong Yi
DOI: 10.1007/S00339-014-8261-2
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摘要: La0.8Ca0.2MnO3 (LCMO) thin films about 200 nm thickness were grown on untilted and tilted (5°, 10° 15°) LaAlO3 (100) single crystal substrates by pulsed laser deposition technique. Electrical properties of the epitaxial studied conventional four-probe technique anisotropic thermoelectric have been investigated laser-induced voltage (LIV) measurements. X-ray diffraction analysis atomic force microscopy results show that prepared LCMO a phase high crystalline quality. The remarkably large temperature coefficient resistance (TCR) values (above 11 %/K) are observed in all films. TCR value reaches 18 %/K film substrate. intensity LIV signals monotonously increases with tilting angles, largest signal is 148 mV fast time response 229 ns for 15°