INTERFACE ELEMENT FOR A TESTING APPARATUS OF ELECTRONIC DEVICES AND CORRESPONDING MANUFACTURING METHOD
作者： Crippa Roberto , Vettori Riccardo
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摘要: An interface element (20) for a testing apparatus of electronic devices comprises at least one support (21) provided with plurality through-openings (22) that house respective interconnections elements (23), which extend between first end (23a) and second (23b). Suitably, the (23) are made conductive elastomer fills openings (21), each interconnection forming channel different opposing faces (Fa, Fb) (21).
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