作者: Martijn F. J. Vos , Bart Macco , Nick F. W. Thissen , Ageeth A. Bol , W. M. M. (Erwin) Kessels
DOI: 10.1116/1.4930161
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摘要: Molybdenum oxide (MoOx) films have been deposited by atomic layer deposition using bis(tert-butylimido)-bis(dimethylamido)molybdenum and oxygen plasma, within a temperature range of 50–350 °C. Amorphous film growth was observed between 50 200 °C at per cycle (GPC) around 0.80 A. For temperatures 250 °C higher, transition to polycrystalline observed, accompanied an increase in GPC up 1.88 A. all the O/Mo ratio found be just below three, indicating were slightly substoichiometric with respect MoO3 contained vacancies. The high purity demonstrated absence detectable C N contamination Rutherford backscattering measurements, H content varying 3 11 at. % measured elastic recoil detection. In addition chemical composition, optical properties are reported as well.