Depth of /spl gamma/-ray interaction within continuous crystals from the width of its scintillation light-distribution

作者: C.W. Lerche , J.M. Benlloch , F. Sanchez , N. Pavon , B. Escat

DOI: 10.1109/TNS.2005.851424

关键词:

摘要: We have studied a new and inexpensive method of measuring the depth interaction (DOI) in /spl gamma/-ray detectors with large-sized scintillation crystals. This takes advantage strong correlation between width undisturbed light-distribution continuous crystals gamma/-ray's DOI. In order to quantify dependence distribution's respect DOI, we first an analytical model tested it by means Monte Carlo (MC) simulations light transport inside crystal. Further present modification commonly used charge division circuit that allows analog instantaneous computation light-distribution's second moment without affecting determination centroid. redesigned resistor network is based on position-sensitive proportional counter (DPC) readout allows, together position sensitive photo-detectors, additional measurement standard-deviation sigma/. proposed using design-tool OrCAD found signal sufficiently large for digitalization. Finally, conducted MC realistic Positron Emission Tomography (PET) detector module setup mimic Lu/sub 2/SiO/sub 5/:Ce/sup 3+/ (LSO) crystal dimensions 40/spl times/40/spl times/10 mm/sup 3/ area photo multiplier tube (PSPMT) H8500 from Hamamatsu. The influence Compton scattering DOI was also estimated simulations. Altogether, obtained les/ 5 mm resolution. PACS: 87.57.Ce, 87.58.Fg, 87.62.+n, 07.85.-m.

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