作者: C. Ziebert , J. K. Krüger , R. Birringer , H. Schmitt , B. Jiménez
DOI: 10.1051/JP4:1998917
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摘要: Thin amorphous PTC-films of 1 μm thickness were produced by rf-sputtering at room temperature. A subsequent annealing process enabled us to prepare different grain sizes which have been characterised x-ray powder diffraction. At the transition from nanocrystalline state elastic modulus c 11 measured HR-Brillouin spectroscopy exhibited a surprising instability. The dielectric constant showed not only expected increase with increasing size but also significant relaxor behavior.