High structural order in thin films of the organic semiconductor diindenoperylene
作者： A. C. Dürr , F. Schreiber , M. Münch , N. Karl , B. Krause
DOI: 10.1063/1.1508436
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摘要: We report extraordinary structural order along the surface normal in thin films of organic semiconductor diindenoperylene (DIP) deposited on silicon–dioxide surfaces. Cross-sectional transmission electron microscopy (TEM), noncontact atomic force (NC–AFM), as well specular and diffuse x-ray scattering measurements were performed to characterize DIP. Individual monolayers essentially upright-standing DIP molecules could be observed TEM images indicative high order. NC–AFM showed large terraces with monomolecular steps ≈16.5 A height. Specular Bragg reflections up Laue oscillations confirmed A semi-kinematic fit data allowed a precise determination oscillatory density ρel.,DIP(z). The mosaicity was obtained smaller than 0.01°.
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