摘要: Publisher Summary This chapter discusses the defects in zinc oxide (ZnO). ZnO is a wide bandgap semiconductor material with numerous present applications, such as varistors and surface acoustic wave devices, future including UV light-emitting diodes transparent field-effect transistors. However, all of these applications are either dependent upon, or affected by, impurities defects. It considers donor-type H, Al, Ga, In; acceptor-type N, P, As, Sb. Among defects, it concentrates on Zn interstitials, vacancies, O complexes each. The main experimental techniques discussed include temperature-dependent Hall-effect low-temperature photoluminescence measurements, because they can alone provide donor acceptor concentrations, energies. Surface conduction important analysis annealed samples, included by means two-layer analysis. topic p-type considered some detail, especially connection most useful dopants.