作者: L. S. Gomez-Villalba , P. López-Arce , R. Fort
DOI: 10.1007/S00339-011-6550-6
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摘要: … X-ray diffraction (XRD) (X’Pert Pro MPD Panalytical X Celerator diffractometer) was used for the mineral phase identification using the JCPDS database. Rietveld refinements [21] were …