作者: Hoo-Jeong Lee , Hai Ni , David T. Wu , Ainissa G. Ramirez
DOI: 10.1063/1.2045565
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摘要: The crystallization of amorphous NiTi thin films was studied using in situ transmission electron microscopy (TEM) methods. Samples were subjected to heating conditions within the microscope and microstructural development monitored recorded. nucleation rate growth determined experimentally by noting number new grains per frame their change size. These parameters compared conventional method kinetic analysis Johnson-Mehl-Avrami-Kolmogorov (JMAK) theory. In it, amount transformed is related fitting that describe overall rate. individual rates found directly with TEM methods have considerable agreement JMAK analysis. This quantitative provides groundwork for control microstructures properties shape memory alloy films.