Statistics of High Purity Nickel Microstructure From High Energy X-ray Diffraction Microscopy
作者： C.M. Hefferan , P. Wynblatt , U. Lienert , A.D. Rollett , R.M. Suter
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摘要: We have measured and reconstructed via forward modeling a small volume of microstructure high purity, well annealed nickel using energy x-ray diffraction microscopy (HEDM). Statistical distributions characterizing grain orientations, intra-granular misorientations, nearest neighbor misorientations are extracted. Results consistent with recent electron backscatter measurements. Peaks in the misorientation angle distribution at 60 degrees ({Sigma}3) 39 ({Sigma}9) resolution limited widths {approx} 0.14 degree FWHM. The analysis demonstrates that HEDM can recover boundary statistics comparable to OIM measurements; more extensive data sets will lead full, five parameter character distributions. Due its non-destructive nature, then watch, both statistically through tracking individual grains boundaries, evolution such processing sample.
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