作者: Xuena Geng , Dantong Ouyang , Zhengang Jiang
DOI: 10.1016/J.ENGAPPAI.2019.103305
关键词:
摘要: In this paper, pattern diagnosis problem in stochastic discrete event system (SDES) is investigated. In a system, an abnormal state may be caused by the occurrence of several normal events. This kind of fault is called fault pattern. The diagnosis problem of fault pattern is defined as pattern diagnosis. Based on the notions of A-diagnosability and AA-diagnosability in SDES, the definitions of PA-diagnosability and PAA-diagnosability for pattern diagnosability in SDES are presented in this paper. In addition, a necessary and …