A model for the Auger electron spectroscopy of systems exhibiting layer growth, and its application to the deposition of silver on nickel

作者: D.C. Jackson , T.E. Gallon , A. Chambers

DOI: 10.1016/0039-6028(73)90389-0

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摘要: The dependence of Auger intensities on deposition time for deposits which grow in layer-by-layer fashion is analysed terms a simple model. It shown that it possible principle to calibrate the signals as function thickness absolutely with no prior assumption values sticking coefficients. extent theory and experimental data silver nickel are agreement examined, deduced coefficients escape depths electrons silver. also found grows epitaxially at room temperature, silver/nickel bicrystals do not alloy after heat treatment.

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