Extracting quantitative information from high resolution electron microscopy

作者: S. Kret , P. Ruterana , A. Rosenauer , D. Gerthsen

DOI: 10.1002/1521-3951(200109)227:1<247::AID-PSSB247>3.0.CO;2-F

关键词:

摘要: … Therefore, the HREM micrographs are made of … quantitative information about the strain fields by simulation of diffraction contrast images; of course the resolution of this measurement is …

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