SPECIMEN ANALYSIS APPARATUS
作者： Sugawara Yuka , Tamura Riku , Yasuda Hiroyuki , Hashimoto Yuichiro
DOI:
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摘要: The purpose of the present invention is to provide a specimen analysis apparatus that can measure carry-over without decreasing processing capacity. according measures first sample including and inner reference material, then second calculates an amount included in from material measured when measuring (see Fig. 6).
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