Column-by-column compositional mapping by Z-contrast imaging.
作者： Sergio I Molina , David L Sales , PL Galindo , David Fuster , Yolanda Gonzalez
DOI: 10.1016/J.ULTRAMIC.2008.10.008
关键词:
摘要: Abstract A phenomenological method is developed to determine the composition of materials, with atomic column resolution, by analysis integrated intensities aberration-corrected Z -contrast scanning transmission electron microscopy images. The exemplified for InAs x P 1− alloys using epitaxial thin films calibrated compositions as standards. Using this approach we have determined two-dimensional wetting layer formed between self-assembled quantum wires on InP(0 0 1) substrates.
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