X-ray spectroscopic investigation of the structure of silica, silicates and oxides in the crystalline and vitreous state

摘要: Abstract The Si Kα1,2 emission lines and their satellite α′, α3 α4 were measured for several samples of vitreous silica (Suprasil W, Infrasil, Suprasil), sodium silicate glasses (8, 15, 20 25 wt% Na2O), crystalline Mg2SiO4 (Forsterite). observed shifts the peak positions indicate a systematic increase electron density on silicon atoms with increasing break-up SiO2 network by OH− or alkali ions. These results are compared information from corresponding Kβ O K bands also quartz, MgO Al2O3. They discussed basis MO theory characteristic physical properties structure glasses. Both closely related to electronegativities relevant metal oxides