作者: A. Ayari , P. Monceau , G. Grubel , C. Detlefs , J.E. Lorenzo
DOI: 10.1051/JP4:20020390
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摘要: We present high resolution X-ray diffraction measurements on NbSe 3 of the charge-density-wave (CDW) relaxation from deformation created by sliding CDW. The data are taken in temperature range 75K < T 105K upper-CDW phase and cover spatial positions up to 800μm current contact. Convenient fits obtained a stretched exponential decay profile yielding exponents μ 0.4-0.7 time-scales r order 1-150ms, becoming faster with increasing sample slowing down distance