A software package for the processing and reconstruction of electron holograms
作者： E. VÖLKL , L. F. ALLARD , B. FROST
DOI: 10.1111/J.1365-2818.1995.TB03655.X
关键词:
摘要: SUMMARY Electron holography is leaving its state of infancy and rapidly becoming a tool for everyday use. This due to the increasing availability field-emission electron microscopes as well use slow-scan CCD cameras, which provide linear image recording so essential holography. At same time, continuing boost in performance desktop computers both hardware software has facilitated handling many complex reconstruction processing tasks We describe here package ‘HoloWorks©’, recently developed at Oak Ridge National Laboratories. designed holograms stressing easy-to-use functions plug-in module Gatan's DigitalMicrograph®.
sci-hub.se 参考文章(13)
Hannes Lichte, Edgar Völkl, Kurt Scheerschmidt, Electron holography: II. First steps of high resolution electron holography into materials science Ultramicroscopy. ,vol. 47, pp. 231- 240 ,(1992) , 10.1016/0304-3991(92)90199-T
Akira Tonomura, Tsuyoshi Matsuda, Junji Endo, Spherical-Aberration Correction of an Electron Lens by Holography Japanese Journal of Applied Physics. ,vol. 18, pp. 1373- 1377 ,(1979) , 10.1143/JJAP.18.1373
T. Hirayama, J. Chen, T. Tanji, A. Tonomura, Dynamic observation of magnetic domains by on-line real-time electron holography Ultramicroscopy. ,vol. 54, pp. 9- 14 ,(1994) , 10.1016/0304-3991(94)90088-4
M. R. McCartney, David J. Smith, Robert Hull, J. C. Bean, E. Voelkl, B. Frost, Direct observation of potential distribution across Si/Si p-n junctions using off-axis electron holography Applied Physics Letters. ,vol. 65, pp. 2603- 2605 ,(1994) , 10.1063/1.112581
David C. Joy, Y.-S. Zhang, X. Zhang, T. Hashimoto, R.D. Bunn, L. Allard, T.A. Nolan, Practical aspects of electron holography Ultramicroscopy. ,vol. 51, pp. 1- 14 ,(1993) , 10.1016/0304-3991(93)90130-P
Kazuo Ishizuka, Number of sampling points required for aberration correction using off-axis electron holography Ultramicroscopy. ,vol. 53, pp. 297- 303 ,(1994) , 10.1016/0304-3991(94)90042-6
Hannes Lichte, Optimum focus for taking electron holograms Ultramicroscopy. ,vol. 38, pp. 13- 22 ,(1991) , 10.1016/0304-3991(91)90105-F
G. M�llenstedt, H. D�ker, Beobachtungen und Messungen an Biprisma-Interferenzen mit Elektronenwellen European Physical Journal. ,vol. 145, pp. 377- 397 ,(1956) , 10.1007/BF01326780
Q. Fu, H. Lichte, E. Völkl, Correction of aberrations of an electron microscope by means of electron holography Physical Review Letters. ,vol. 67, pp. 2319- 2322 ,(1991) , 10.1103/PHYSREVLETT.67.2319
Edgar Völkl, Hannes Lichte, Electron holograms for subångström point resolution Ultramicroscopy. ,vol. 32, pp. 177- 179 ,(1990) , 10.1016/0304-3991(90)90035-K