作者: Yue-Ying Lau , Ronald M Gilgenbach
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摘要: Abstract : We compute the Green s function on a slow wave structure. derive scaling laws for contact resistance of both bulk and thin film contact, with general aspect ratios vastly different resistivity in members. discover voltage scale, which depends only material property, that characterizes robustness against runaway heating due to electro-thermal instability. identify role RF magnetic field, electric enhanced rough surfaces including bumps troughs. investigate effects surface irregularities, more generally random manufacturing errors, performance traveling amplifiers. construct law limiting current spherical cylindrical diode, is first successful attempt 90 years provide simple analytic celebrated (numerical) solutions Langmuir Blodgett. new ballistic key component vacuum transistor , high-speed envisioned future.