Fault Models in Reversible and Quantum Circuits

摘要: In this chapter we describe faults that can occur in reversible circuit as compared to classical irreversible circuits. Because there are many approaches from circuits being adapted circuits, it is necessary analyze what exists appear well. Thus focus on comparing technology with and quantum technology. The comparison done the point of view information technologies. We show impact computing strongly modifies fault types thus models should be considered. Unlike non-reversible transistor based specify type implementation used different technologies affected by faults. Moreover level their analysis must revised precisely capture effects properties gates share several similarities By not doing so available testing would able properly detect relevant addition, if directly applied without revision modifications, presented procedure for such cannot physically given observation these various clearly demonstrates Consequently results design more precise tests logic described differences between occurring means new algorithms detection implemented specifically particular