Nanoscale Indentation and Scratch of Short Carbon Fiber Reinforced PEEK/PTFE Composite Blend by Atomic Force Microscope Lithography
作者： Yanchun Han , Stefan Schmitt , Klaus Friedrich
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摘要: The atomic force microscope (AFM) has become a popular tool for characterizing surfaces of different types materials. In this paper new technology AFM–SPM lithography was used to conduct nanoscale scratch and indentation tests on short carbon fiber reinforced PEEK/PTFE composite blend. the test, by moving tip across surface at constant velocity fixed applied force, grooves with nanometer scale dimensions were fabricated PEEK matrix surfaces. consisted central trough pile-ups each side. These provided information about deformation mechanisms resistance individual phases. polymeric phases, microploughing microcutting are dominant wear mechanisms. harder i.e., graphite fibers, get worn microcracking events.
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sci-hub.se 参考文章(16)
Karl-Heinz Zum Gahr, Microstructure and Wear of Materials ,(1987)
J.A. Williams, Analytical models of scratch hardness Tribology International. ,vol. 29, pp. 675- 694 ,(1996) , 10.1016/0301-679X(96)00014-X
J.A. Lin, W.N. Unertl, Nanoscale deformations of polyimide with a force microscope Journal of Adhesion Science and Technology. ,vol. 8, pp. 913- 927 ,(1994) , 10.1163/156856194X00528
E. R. Kral, K. Komvopoulos, D. B. Bogy, Hardness of Thin-Film Media: Scratch Experiments and Finite Element Simulations Journal of Tribology-transactions of The Asme. ,vol. 118, pp. 1- 11 ,(1996) , 10.1115/1.2837078
K.H.Zum Gahr, Modelling of two-body abrasive wear Wear. ,vol. 124, pp. 87- 103 ,(1988) , 10.1016/0043-1648(88)90236-0
T. Yokohata, K. Kato, Mechanism of nanoscale indentation Wear. ,vol. 168, pp. 109- 114 ,(1993) , 10.1016/0043-1648(93)90205-Z
Hai Tai Lee, Jae Seuk Oh, Seong-Ju Park, Kang-Ho Park, Jeong Sook Ha, Hyung Joun Yoo, Ja-Yong Koo, Nanometer-scale lithography on H-passivated Si(100) by atomic force microscope in air Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. ,vol. 15, pp. 1451- 1454 ,(1997) , 10.1116/1.580560
B. Wei, K. Komvopoulos, Nanoscale Indentation Hardness and Wear Characterization of Hydrogenated Carbon Thin Films Journal of Tribology. ,vol. 117, pp. 594- 601 ,(1995) , 10.1115/1.2831521
Bharat Bhushan, Vilas N. Koinkar, NANOINDENTATION HARDNESS MEASUREMENTS USING ATOMIC FORCE MICROSCOPY Applied Physics Letters. ,vol. 64, pp. 1653- 1655 ,(1994) , 10.1063/1.111949
A. Majumdar, P. I. Oden, J. P. Carrejo, L. A. Nagahara, J. J. Graham, J. Alexander, Nanometer‐scale lithography using the atomic force microscope Applied Physics Letters. ,vol. 61, pp. 2293- 2295 ,(1992) , 10.1063/1.108268