Analyzing Electric Double Layers with the Atomic Force Microscope

摘要: The sections in this article are Introduction Surface Forces Aqueous Electrolyte DLVO Forces Early Surface Force Measurements The Apparatus The Osmotic Stress Method The Bimorph Apparatus Force Measurements with the AFM The Practice of Cantilever The Probe: Tip or Colloidal Particle An Instability: Jump-In AFM-Related Techniques Theory Measuring AFM Electrolyte Derjaguins Approximation The Electrostatic Double-Layer Force Other Electrolyte AFM Electric Double Layer Between Solid Surfaces High Potentials Between Deformable Surfaces Imaging Charge Distributions Conclusion and Outlook