AC loss of Ag–Bi2223 tapes
作者： H. Luo , J.W. Lin , S.Y. Ding
DOI: 10.1016/S0921-4534(02)02223-2
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摘要: Abstract We have studied the effect of flux creep on AC loss Ag–Bi2223 tapes by three methods: transport V – I curve, M H hysteresis loop and susceptibility ( χ T curve). It was found that d /d t , f affected apparently in addition to DC field, respectively. Comparison between data ways shows a satisfactory agreement with each other. Numerical simulation conducted understand experimental based creep. shown dependence losses could only be understood model rather than any static one.
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