ESD protection for high voltage applications

作者: Jian-Hsing Lee , Deng-Shun Chang

DOI:

关键词:

摘要: An electrostatic discharge (ESD) protection device includes a diode located in substrate and an N-type metal oxide semiconductor (NMOS) the adjacent diode, wherein both NMOS are coupled to input device, at least portion of collectively form ESD device.

参考文章(18)
Kuo-Feng Yu, Jian-Hsing Lee, Tong-Chern Ong, Ming-Hsiang Song, Shu-Chuan Lee, Shao-Chang Huang, Yi-Hsun Wu, Electrostatic discharge protection device and method for its manufacture ,(2005)
Phillip C. Jozwiak, Russ Mohn, Markus P.J. Mergens, John Armer, Koen G. Verhaege, Christian C. Russ, High Holding Current SCRs (HHI-SCR) for ESD protection and latch-up immune IC operation electrical overstress/electrostatic discharge symposium. pp. 10- 17 ,(2002)
Jian-Hsing Lee, Ping-Lung Liao, Shui-Hung Chen, Jiaw-Ren Shih, Highly latchup-immune CMOS I/O structures ,(2002)
S Paulson, A Helser, M Buongiorno Nardelli, RM Taylor, M Falvo, R Superfine, S Washburn, Tunable Resistance of a Carbon Nanotube-Graphite Interface Science. ,vol. 290, pp. 1742- 1744 ,(2000) , 10.1126/SCIENCE.290.5497.1742
B. Q. Wei, R. Vajtai, P. M. Ajayan, Reliability and current carrying capacity of carbon nanotubes Applied Physics Letters. ,vol. 79, pp. 1172- 1174 ,(2001) , 10.1063/1.1396632
Kuo-Chio Liu, Jian-Hsing Lee, Combined NMOS and SCR ESD protection device ,(1999)
Wei-Fan Chen, Ta-Lee Yu, Shu-Chuan Lee, Shi-Tron Lin, High-voltage tolerance input buffer and ESD protection circuit ,(2000)
Jian-Hsing Lee, Shih-Chyi Wong, Kuo-Reay Peng, Low capacitance ESD protection device ,(2002)