The quality dependence of LiF TLD in megavoltage photon beams: Monte Carlo simulation and experiments
作者： Paul N Mobit , Philip Mayles , Alan E Nahum
DOI: 10.1088/0031-9155/41/3/004
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摘要: The quality dependence of LiF TLD in megavoltage photon beams with qualities from 60Co gamma-rays to 25 MV x-rays has been studied experimentally against ion chamber measurements and theoretically by Monte Carlo simulation using the EGS4 code system. experimental findings are that energy 1 mm thick TLD-100 (micro-rods chips) on average decreases slowly 1.0 for 0.989 +/- 1.3% 6 (TPR20/10 = 0.685) 0.974 0.800) relative gamma-rays. results vary 0.991 0.9% 0.978 0.8% x-rays. Differences between chips micro-rods were negligible there was no difference TLDs irradiated water or Perspex (PMMA). shows contribution total absorbed dose interactions diameter long material varies 50% 10% When micro-rod increased 5 significant change response computed even though scored cavity 85% 30%
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