IR spectral depth profiling using fourier transform photothermal beam deflection
作者： P.G. Varlashkin , M.J.D. Low
DOI: 10.1016/0020-0891(86)90020-5
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摘要: Abstract FTIR photothermal beam-deflection spectroscopy (PBDS) was used to make spectral depth-profiling measurements with synthetic bilayer samples of polyethylene/nitrocellulose, a commercial plastic having surface printing and single human hair. A Digilab interferometer modified operate at several scan speeds record the spectra, without cell-resonance problems found photoacoustic (PAS). The utility depth profiling is discussed; significant S/N improvements seem be needed and, either PBDS or PAS, wider range modulation frequencies required for methods useful.
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