WS2 nanotubes as tips in scanning probe microscopy
作者： A. Rothschild , S. R. Cohen , R. Tenne
DOI: 10.1063/1.125526
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摘要: WS2 nanotubes a few microns long were attached to microfabricated Si tips and tested afterwards in an atomic force microscope by imaging “replica” of high aspect ratio, i.e., deep narrow grooves. These nanotube provide considerable improvement image quality for such structures when compared with commercial ultrasharp tips. The tip apex shape was extracted blind reconstruction from Ti spikes, showing smooth cylindrical profile up the end.
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