作者: X. Li , D. G. Zhao , D. S. Jiang , P. Chen , Z. S. Liu
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摘要: The effects of Al composition in p-type AlGaN electron blocking layer (EBL) on leakage and device performance InGaN-based quantum well (QW) laser diodes (LDs) are numerically investigated connection with the depth QWs. It is found that effectiveness EBL depends much content In InGaN effective for low-In-content QW LDs to add moderate EBL, while it hardly helpful even harmful high-In-content increase content. addition, too unfavorable all due downward conduction band-bending last barrier (LQB) layer.