X‐ray topographic examination of large paraffin single crystals

摘要: The internal microstructure of large melt‐grown paraffin (n‐eicosane, C20H42) single crystals was examined by the Lang x‐ray diffraction projection topographic technique. Crystal selection facilitated use an electro‐optical system which permitted instantaneous display Laue transmission patterns on a television monitor. were oriented and planes selected standard (001) stereographic plotted from computed angles between crystallographic planes. A second direct viewing images for rapid alignment camera ensured uniformly exposed topographs. X‐ray topographs obtained in as‐grown, plastically deformed, γ‐irradiated states. results indicate that both plastic deformation γ irradiation caused marked changes crystals, topography can be successfully exploited t...