Method and apparatus for detecting defects of printed circuit patterns

作者: Yasuo Nakagawa , Takanori Ninomiya , Keiya Saito

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摘要: A printed circuit pattern inspection system, in which the optical image of patterns is transformed into an electrical signal, signal converted a binary digital connectivity relationship between selected two points form examined, connection data representative and expressed by pair numbers given to generated, compared with design produced from information circulation list linkage relationship, whereby determination defectiveness made basing on result comparison.

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