作者: Diego Pontoni , T. Narayanan , Adrian R. Rennie
DOI: 10.1107/S0021889802000493
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摘要: Data with a wide dynamic range of intensity can be collected pinhole high-brilliance small-angle X-ray scattering (SAXS) camera using an image-intensified charge-coupled device (CCD) detector. The point spread function (PSF) this detector has narrow peak broad low tail such that high level scattered at small angles cause significant background in the elements higher angles. A correction scheme for long PSF is needed when integrating area used measuring spans four to five orders magnitude. procedure described contribution by masking part from radiation absorbing material. In order measure PSF, it necessary use high-intensity spot, which readily achieved sample scatters strongly Although over many pixels, sharp features silica chosen study permit one obtain simultaneously both and parts PSF. data are compared actual function, been measured exactly point-geometry Bonse–Hart camera. advantages discussed.